The time to develop and deploy functional test solutions can be the critical path item when moving new products from design to manufacturing. Creating completely customized functional test solutions can be costly and time-consuming. Deploying functional test systems at the board and product level based upon a modular approach that easily scale from In-circuit defect detection test can reduce design and deployment time, minimize costs, and expand throughput, flexibility and accuracy. This Webcast will explore steps for configuring high-volume, high-mix test system derived from a test specification; discuss standardization paths along the production line configuration, and how addressing test from an end-to-end strategy gives you a head start to your production and faster time to market. A case example will be presented.
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